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Design For Test

test facilitated in a product's design.

See Also: DFT, BIST


Showing results: 1006 - 1020 of 1333 items found.

  • Tapered Anechoic Chamber

    Cuming-Lehman Chambers

    It’s nearly impossible to perform VHF/UHF measurements in a rectangular chamber. In the 1960’s Emerson determined that tapering one end of an Anechoic Chamber would cause the chamber to act like an indoor ground reflection range.Tapered Chambers work very well at the lower frequencies. Their design forms a uniform illumination across the test region. The tapered end of the chamber forces the wall images close together forming a source antenna array. Tapered Chambers are usually a less expensive option compared to rectangular antenna measurement chambers or compact ranges.

  • High Speed Machinery Test Rigs

    Barbour Stockwell, Inc

    designs and builds all kinds of rigs for testing the components of high speed machinery. As in our spin pits, BSi's unsurpassed ability to generate and precisely control extraordinarily high speeds is the key competitive advantage. BSi engineers also draw on our vast experience to provide reliable drives and rigs to meet the most demanding requirements under the most extreme conditions. We have engineered and manufactured rigs for testing bearings at speeds to 250,000 rpm. We have delivered test benches for testing abradable seals at temperatures to 1100 deg. C.

  • Booster and In-line Amplifier

    Amonics Ltd.

    Amonics' EDFA range adopts unique design to produce maximum signal gain and saturated output power while maintaining low noise figure, enabling test capabilities in system or component level manufacturing and characterizing processes, as well as facilitating highly demanding R&D applications. The compact turnkey benchtop or 19" rackmount unit incorporates a user-friendly front panel housing with a LCD monitor display, key switch, power control knob and optical connectors. An integrated RS232 computer interface enables easy control, diagnostic functions and data acquisition.

  • Industrial Vibration Sensor

    IVS-500 - Polytec GmbH

    The new IVS-500 Industrial Vibration Sensor is the key to fast acoustic quality inspection, structure-borne noise analysis and reliable pass-fail decisions. This Laser sensor measures reliably, in demanding industrial environments, without contact and therefore without wear and on virtually all surfaces. Costs and yields are therefore optimized by reducing false rejects in the production and assembly process. The simple setup and ruggedized sensor design of the IVS-500 enable a smooth integration into production test systems. Complemented with the software tool QuickCheck, Polytec offers a comprehensive solution for reliable pass/fail analysis.

  • Remote Radio Head 50 GHz

    CMPHEAD50 - Rohde & Schwarz GmbH & Co. KG

    The R&S®CMPHEAD50 is the only remote radio head supporting bi-directional testing at five mmWave frequency bands with one hardware set and EVM booster ports. It extends the R&S®CMP200 radio communication tester to frequency range 2 (FR2/ FR2-1). The improved performance ensures optimum accuracy for testing next generation FR2 RF designs – from early development to final certification and regulatory compliance. Test with confidence and ensured RF performance with the latest state-of-the-art measurement solution from Rohde&Schwarz.

  • PCI-6229, 32 AI (16-Bit, 250 kS/s), 4 AO, 48 DIO PCI Multifunction I/O Device

    779068-01 - NI

    32 AI (16-Bit, 250 kS/s), 4 AO, 48 DIO PCI Multifunction I/O Device - The PCI-6229 offers analog I/O, correlated digital I/O, two 32-bit counters/timers, and digital triggering. The device delivers low-cost, reliable DAQ capabilities in a wide range of applications from simple applications in laboratory automation, research, design verification/test, and manufacturing test. You can add sensor and high-voltage measurement capability to your device with SCC or SCXI signal conditioning modules. The included NI-DAQmx driver and configuration utility simplify configuration and measurements.

  • PCI-6221, 16 AI (16-Bit, 250 kS/s), 2 AO, 24 DIO PCI Multifunction I/O Device

    779418-01 - NI

    16 AI (16-Bit, 250 kS/s), 2 AO, 24 DIO PCI Multifunction I/O Device - The PCI-6221 offers analog I/O, correlated digital I/O, two 32-bit counters/timers, and digital triggering. The device delivers low-cost, reliable DAQ capabilities in a wide range of applications from simple applications in laboratory automation, research, design verification/test, and manufacturing test. You can add sensor and high-voltage measurement capability to your device with SCC or SCXI signal conditioning modules. The included NI-DAQmx driver and configuration utility simplify configuration and measurements.

  • Custom Designed Environmental Chambers

    Cincinnati Sub-Zero Products

    Our strength lies in our ability to provide custom solutions to complicated testing needs. Our world-class design engineering team has the experience needed to tailor environmental test chambers to work in unison with existing machinery, unique size requirements, and custom testing conditions. Whether the environmental chamber is used for testing microchips and processors for leading computer manufacturers, or temperature, humidity, and altitude rated chambers  for leading aerospace and defense contractors, our detail oriented team works to provide solutions that meet or exceed project requirements and industry standards for quality.

  • FPGA Test System

    DO-254/CTS - Aldec, Inc.

    DO-254/CTS™ is a fully customized hardware and software platform that augments target board testing to increase verification coverage by test and satisfy the verification objectives of DO-254/ED-80. The target design runs at-speed in the target device mounted on the custom daughter board. The simulation testbench is used as test vectors to enable requirements-based testing with 100% FPGA pin-level controllability and visibility necessary to implement normal range and abnormal range tests. The FPGA testing results are captured at-speed and displayed using a simulator waveform viewer for advanced analysis and documentation.

  • ESD & Latch-Up Test System

    Thermo Fisher Scientific Inc.

    Identify and help correct ESD and latch-up susceptibility issues on sensitive integrated circuit components prior to full-scale production with the Thermo Scientific™ MK.2-SE ESD and Latch-Up Test System. The MK.2-SE test system provides advanced capabilities to test high pin count IC devices to Human Body Model (HBM) and Machine Model (MM) ESD standards. The system’s pulse delivery design addresses wave form hazards such as trailing pulse and pre-discharge voltage rise, and performs Latch-Up testing per the JEDEC EIA/JESD 78 Method.

  • Power Conversion Automated Test Platform

    C8000 - Chroma Systems Solutions, Inc.

    Power conversion testing is our core competency. Chroma’s engineering delivers cost-effective automated test system and software platforms to fit your Design Validation Testing (DVT) requirements in the lab or High Speed Functional Testing in the production line. Built into each system are Chroma’s years of expertise, precision instrumentation, pre-written test libraries, and local program management with global support. From power conversion to battery to electrical safety, our test systems will maximize your time, improve your validation process, and increase your throughput.

  • Long Gauge Length Axial Extensometers

    Model 3542L - Jinan Testing Equipment IE Corporation

    The dual flexure design makes the 3542L very rugged and insensitive to vibrations. These extensometers are designed for testing a wide range of materials including metals, plastics, composites and ceramics. Epsilon’s Model 3543 is recommended for applications requiring long gauge lengths and larger measuring ranges.The Model 3542L comes standard with Epsilon’s quick attach kit, making it easy to mount the extensometer on the test specimen. The quick attach kit can be removed, allowing mounting of the extensometer with springs or rubber bands.The 3542L extensometers are strain gaged devices, making them compatible with any electronics designed for strain gaged transducers. Most often they are connected to a test machine controller. The signal conditioning electronics for the extensometer is typically included with the test machine controller or may often be added. In this case the extensometer is shipped with the proper connector and wiring to plug directly into the electronics. For systems lacking the required electronics, Epsilon can provide a variety of solutions, allowing the extensometer output to be connected to data acquisition boards, chart recorders or other equipment.

  • Programmable DC Electronic Load

    63000 Series - Chroma ATE Inc.

    The 63000 Series programmable DC electronic loads are reliable, precision instruments primarily designed to test switching power suppl ies, A/D power suppl ies, power electronic components, adapters, 3C batteries and chargers. Its maximum 350W rated power makes it suitable for testing numerous types of lower power devices. The 63000 Series offers models in two operating voltages 150V models, with 250W and 350W power levels up to 60A in a single unit. Their compact and light weight design make these loads easy to move around which is ideal for R&D and design validation. Each model of the 63000 Series has unique user-def ined waveform (UDW) funct ion capable of simulating real-world custom waveforms. In addition, a data storage function has been built in for saving and recalling up to 100 stored settings at any time. For automated testing, these save and recall functions can save a great deal of time. The 63000 Series has 3 power ranges that can precisely measure the voltage and current in real time. Since short circuit testing is a critical test item, the 63000 provides short circuit simulation to effectively address application demands for power and automated testing.

  • High Temperature, Low Strain, Extended Performance Capacitive Extensometers

    Model 7650A - Jinan Testing Equipment IE Corporation

    Model 7650A extensometers measure strains with extremely high precision due to their design features and low strain range. All models are capable of tension and compression strain measurement, and may be used for fatigue testing under fully reversed load and strain conditions at frequencies up to 10 Hz.All 7650A models mount rigidly on the load frame and incorporate slide mounting to bring the extensometer into contact with the specimen. The gauge length is set automatically before mounting on the test specimen, which allows for hot mounting after thermal equilibrium has been reached.These units are specifically designed to provide high accuracy, high resolution measurements and perform high temperature fatigue testing at the highest possible frequencies. They incorporate capacitive sensors for low operating force and include electronics with programmable filtering and multi-point linearization for improved performance and accuracy. The overall design minimizes, and in many cases virtually eliminates, any influence from common lab environment vibrations.These water-cooled extensometers are equipped with high purity alumina rods for specimen contact when testing to 1200℃ (2200°F). Silicon carbide rods are used for the 1600℃ (2900°F) high temperature option.The Model 7650A is often customized for specific test needs. Contact Epsilon for a configuration that matches your requirement.

  • PANAVIA Modules

    AIM GmbH

    AIM’s PANAVIA test, simulation, monitoring and analysis modules use our field proven Common Core hardware design giving you the best performance, best feature set and highest functional integration on the market. The use of SoC (System on Chip) based core design with one processor for real time bus protocol support, massive memory and IRIG-B time code encoder/decoder functions are standard. AIM delivers versions of our modules with extended temperature range and conformal coating. With 8 Tx and 8 Rx channels per module, functions include autonomous transmit sequencing, continuous clock and data transmissions, host controlled double buffering, programmable interrupts, data selection on specific tag identifier, selectable triggers on data and/or tags with full protocol error injection/detection, real time bus recording and time stamping to ensure your bus integrity. Each module is delivered with a Board Support Package (BSP) comaptible to the legacy PCI and cPCI hardware modules.

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